IC White Papers

(View All Report Types)
Built-in Self-test (BIST) Using Boundary Scan
sponsored by Texas Instruments, Inc.
WHITE PAPER: This document shows how existing architectures can be modified to conform to IEEE 1149.1 architecture.
Posted: 09 May 2000 | Published: 01 Dec 1996

Texas Instruments, Inc.

Optimizing the Private Cloud with Intel® and Microsoft*
sponsored by Intel and Microsoft
WHITE PAPER: The Intel® Xeon® processor family provides a reliable, available, and serviceable infrastructure which works seamlessly with Windows Server 2008 R2. By leveraging the power of Intel technology, businesses can enhance their private cloud infrastructure to help IT administrators and end-users receive an efficient, secure, and simplified experience.
Posted: 16 May 2011 | Published: 29 Mar 2011

Intel and Microsoft

Hyper-V® 2012 vs. vSphere™ 5.1 - Understanding the Differences
sponsored by SolarWinds, Inc.
WHITE PAPER: In order to help vSphere administrators make the knowledge leap between VMware vSphere and Microsoft Hyper-V, this paper will outline the differences between the currently shipping products from both VMware and Microsoft: vSphere 5.1 and Hyper-V 2012. Discover key features in the products and be exposed to the feature details as that may exist.
Posted: 26 Aug 2013 | Published: 26 Aug 2013

SolarWinds, Inc.

HP Integrity NonStop Servers: Standards-based Innovation for the Highest Levels of Service
sponsored by Hewlett Packard Enterprise
WHITE PAPER: In this white paper, discover a comprehensive portfolio of servers which deliver flexibility to respond quickly and effectively to changes, with the availability, scalability and cost features that are most appropriate for your business continuity needs.
Posted: 19 Jul 2006 | Published: 01 Jul 2006

Hewlett Packard Enterprise

The Intelligent Choice for Business Intelligence
sponsored by DellEMC and Intel®
WHITE PAPER: Learn how Dell has partnered with Microsoft to create three validated partner reference configurations for Business Intelligence and Data Warehousing. This white paper discusses BI and DW applications for SQL Server 2005.
Posted: 05 Dec 2007 | Published: 01 Dec 2007

DellEMC and Intel®

Extending the World's Most Popular Processor Architecture
sponsored by Intel Corporation
WHITE PAPER: This paper will provide a brief background on instruction set architecture (ISA) and review new instructions, including SSE4 vectoring compiler and media accelerators, SSE4 efficient accelerated string and text processing, and Application T...
Posted: 26 Jun 2007 | Published: 01 Jan 2006

Intel Corporation

Dual-Core Intel® Itanium® 2 Processor 9000 Series
sponsored by Intel and Microsoft
WHITE PAPER: Learn how the Dual-Core Intel® Itanium® 2 processor 9000 from the Dual-core Intel® Itanium® 2 Processor 9000 Series can deliver new levels of performance, flexibility and value for your data-intensive business and te...
Posted: 10 Jul 2007 | Published: 01 Jan 2006

Intel and Microsoft

Case Studies with Intel vPro Processor Technology
sponsored by Intel Corporation
WHITE PAPER: Read this white paper for an analysis of early testing for Intel vPro processor technology in IT departments. See real-world examples of how Intel vPro technology improves security due to the hardware based capabilities not possible with software a...
Posted: 21 Nov 2007 | Published: 21 Nov 2007

Intel Corporation

Best Practices for a Data Warehouse on Oracle Database 11g
sponsored by Oracle Corporation
WHITE PAPER: In order to ensure the enterprise data warehouse will get the optimal performance and will scale as your data set grows you need to get three fundamental things correct, the hardware configuration, the data model and the data loading process.
Posted: 19 Jan 2009 | Published: 19 Jan 2009

Oracle Corporation

National Instruments Synchronization and Memory Core - A Modern Architecture for Mixed Signal Test
sponsored by National Instruments
WHITE PAPER: By providing a common architecture for the 100 MS/s mixed-signal prototyping a test suite of instruments, the SMC enables the instruments to test systems where digital and analog signals are side by side.
Posted: 28 Aug 2003 | Published: 01 Jul 2003

National Instruments